Scanning Electron Microscopy (SEM) and Optical Inspection

Scanning Electron Microscopy (SEM)
Device are observed using secondary electron emission to visualize the morphology and the topography of the inspected surface, and detect potential inter or intra-granular defects, cracks, crevices, pitting or any abnormal surface configuration. The most significant and representative surface defects are recorded (photography) and dimensional characteristics measured. Observations with secondary electron emission with SEM X25 to X200000 magnifications. Dimension of defect are measured with a precision of +/-5%.

Optical Inspection
Samples are placed directly or with an intermediate support on the Smartscope tray. Dimensions defined in the protocol are measured. Magnification is up to X145 with precision of +/-5µm.

Measured Parameters

  • Optical inspection : geometric dimensions + pictures
  • Scanning Electron Microscopy Inspection (SEM) : Observed defects are recorded (pictures). Morphological and dimensional characteristics of defected are estimated.

Scope

  • All types of medical devices

Service Levels

Related Tests

OLE1904

Stent SEM Inspection after Accelerated Fatigue 400 M cycles

Stent SEM Inspection after Accelerated Fatigue 400 M cycles


ViVitro Labs Advantages

Many companies look to academia to handle their testing needs due to the reduced cost. With ViVitro Laboratory Services you gain the following advantages:

Time to Market
We understand how critical your timelines are. Our expertise and experience ensure your schedule is met and our commitments are delivered on time.

ISO 17025 Accredited
For studies used for regulatory approval this is a must. Accredited by A2LA and Cofrac.

Free Initial Consultations
All of our studies are scoped via no-cost, no obligation, collaborative consultation.

Guaranteed Confidentiality
We happily provide Non-Disclosure Agreements for all services, including initial consultation.

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