Scanning Electron Microscopy (SEM) and Optical Inspection
Scanning Electron Microscopy (SEM)
Device are observed using secondary electron emission to visualize the morphology and the topography of the inspected surface, and detect potential inter or intra-granular defects, cracks, crevices, pitting or any abnormal surface configuration. The most significant and representative surface defects are recorded (photography) and dimensional characteristics measured. Observations with secondary electron emission with SEM X25 to X200000 magnifications. Dimension of defect are measured with a precision of +/-5%.
Samples are placed directly or with an intermediate support on the Smartscope tray. Dimensions defined in the protocol are measured. Magnification is up to X145 with precision of +/-5µm.
- Optical inspection : geometric dimensions + pictures
- Scanning Electron Microscopy Inspection (SEM) : Observed defects are recorded (pictures). Morphological and dimensional characteristics of defected are estimated.
- All types of medical devices
Stent SEM Inspection after Accelerated Fatigue 400 M cycles
ViVitro Labs Advantages
Many companies look to academia to handle their testing needs due to the reduced cost. With ViVitro Laboratory Services you gain the following advantages:
Time to Market
We understand how critical your timelines are. Our expertise and experience ensure your schedule is met and our commitments are delivered on time.
Free Initial Consultations
All of our studies are scoped via no-cost, no obligation, collaborative consultation.
We happily provide Non-Disclosure Agreements for all services, including initial consultation.